Yield and Reliability in Microwave Circuit and System Design

Author:   Michael D. Meehan ,  John Purviance
Publisher:   Artech House Publishers
ISBN:  

9780890065273


Pages:   300
Publication Date:   01 December 1993
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Yield and Reliability in Microwave Circuit and System Design


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Overview

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

Full Product Details

Author:   Michael D. Meehan ,  John Purviance
Publisher:   Artech House Publishers
Imprint:   Artech House Publishers
Dimensions:   Width: 15.20cm , Height: 2.00cm , Length: 22.90cm
Weight:   0.611kg
ISBN:  

9780890065273


ISBN 10:   0890065276
Pages:   300
Publication Date:   01 December 1993
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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