Overview

X-Ray Radiation of Highly Charged Ions is a comprehensive collection of atomic characteristics of highly charged ion (HCI) sources and elementary processes related to X-ray radiation: energy levels, wavelengths, transition probabilities, cross sections, and rate coefficients. The material covers a broad range of elementary processes occuring in hot laboratory and astrophysical plasmas: radiative and dielectronic recombination, radiative electron capture, radiation transfer and excitation, and others. The book comprises a large amount of figures, tables, simple formulas, and if possible scaling laws for radiative and collisional characteristics of HCI. The data presented is useful for specialists who deal with X-ray spectroscopy, physics of HCI, heavy-particle collisions, and thermonuclear fusion.

Full Product Details

Author:   Heinrich F. Beyer ,  H.-J. Kluge ,  V.P. Shevelko
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   1997 ed.
Volume:   19
Dimensions:   Width: 15.50cm , Height: 1.50cm , Length: 23.50cm
Weight:   1.170kg
ISBN:  

9783540631859

ISBN 10:   3540631852
Pages:   233
Publication Date:   14 August 1997
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of print, replaced by POD  
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