Overview

This book provides readers a good overview of some of most recent advances in the field of hybrid pixelated detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics conducted at leading research institutions in the world. The conversion of the X-ray signal into an analogue/digital value is discussed, as well as a review of CMOS chips used for X-ray image sensors. Applications of hybrid pixel detectors are discussed, such as medical imaging, high energy physics, space, non-destructive testing and security.   Provides coverage of a broad range of topics, from international experts in academia and industry; Includes in-depth analysis of how to optimize X-ray detection and electronics for X-ray detection; Covers both technology and applications in a number of different domains.

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9783031352409

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Conny Hansson has a M.Sc. in both Space Engineering, Umea University, Sweden, and Electrical Engineering, Halmstad University, Sweden, and earned his doctorate in Material Science from the University of Manchester, United Kingdom. He has spent over 15 years engaged in the design, construction, characterization, and implementation of novel X-ray, gamma-ray, charged particle, and IR detectors for a number of different application areas including space science, particle physics, accelerator facilities, security, and medical imaging. During this time Dr. Hansson has worked at the European Space Agency’s European Space Research and Technology Center (ESTEC), the Dutch National Institute for Subatomic Physics (NIKHEF), both in the Netherlands, and at Redlen Technologies Inc., Canada. Much of his work has been dedicated to the development of compound semiconductor sensors and dedicated Application Specific Integrated Circuits (ASIC’s), and as such he has been involved in all areas ofrequired technical development, including sensor growth and characterization; ASIC development; prototype detector qualification; integration of detector in final instrumentation; and evaluation of instrument performance. He currently holds a Group Leader role in the LCLS detectors group, SLAC National Accelerator Laboratory, Stanford University, USA. Krzysztof (Kris) Iniewski is the Director of Detector Architecture and Application, managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 20+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited several books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.

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