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OverviewFull Product DetailsAuthor: Joel Greenberg (Duke University, Durham, North Carolina, USA) , Krzysztof Iniewski (Emerging Technologies CMOS Inc., British Columbia, Canada)Publisher: Taylor & Francis Inc Imprint: CRC Press Inc Weight: 0.521kg ISBN: 9781498783613ISBN 10: 1498783619 Pages: 256 Publication Date: 21 November 2018 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1 Coded Aperture X-Ray Diffraction Tomography. 2 Semiconductor Sensors for XRD Imaging. 3 Integrated Circuits for XRD Imaging. 4 Applications of X-Ray Diffraction Imaging in Medicine. 5 Materials Science of X-Ray Diffraction 6 X-Ray Diffraction and Focal Construct Technology. 7 X-Ray Diffraction Tomography: Methods and Systems. 8 Energy-Resolving Detectors for XDi Airport Security Systems.ReviewsAuthor InformationJoel A. Greenberg received his B.S.E. in Mechanical and Aerospace Engineering from Princeton University in 2005, and his Ph.D. in physics from Duke University in 2012. He then joined the Duke Imaging and Spectroscopy Program in 2012 as a research scientist and technical/project manager of the computational adaptive X-ray imaging (CAXI) program. Since 2014, Joel has been an Assistant Research Professor of Electrical and Computer Engineering at Duke University and a member of the Fitzpatrick Institute for Photonics. He has published over 30 papers in the areas of nonlinear optics, cold atom physics, compressed sensing and X-ray imaging. His current research focuses on computational sensing and its application to security, medical, and industrial imaging and detection. Tab Content 6Author Website:Countries AvailableAll regions |
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