Overview

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

Full Product Details

Author:   Yoshio Waseda ,  Eiichiro Matsubara ,  Kozo Shinoda
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2011 ed.
Dimensions:   Width: 15.50cm , Height: 1.90cm , Length: 23.50cm
Weight:   0.712kg
ISBN:  

9783642166341

ISBN 10:   3642166342
Pages:   310
Publication Date:   09 March 2011
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Fundamental Properties of X-rays.- Geometry of Crystals.- Scattering and Diffraction by Atoms and Crystals.- Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures.- Reciprocal Lattice and Integrated Intensity from Crystals.- Symmetry Analysis for Crystals and the Use of International Tables.- Solved Problems.

Reviews

From the reviews: The authors have developed their course lecture notes into a useful book that is suitable for graduate students of materials science and engineering who use X-ray diffraction techniques. ... This book is a very concise presentation of the theory of scattering and diffraction and the determination of crystal structures. ... The biggest strength of this book are the solutions that illustrate the quantitative aspects of the subject. The illustrations complement the text and there are many tables of real diffraction data and calculations of structures. (Barry R. Masters, Optics & Photonics News, April, 2012)

From the reviews: The authors have developed their course lecture notes into a useful book that is suitable for graduate students of materials science and engineering who use X-ray diffraction techniques. ! This book is a very concise presentation of the theory of scattering and diffraction and the determination of crystal structures. ! The biggest strength of this book are the solutions that illustrate the quantitative aspects of the subject. The illustrations complement the text and there are many tables of real diffraction data and calculations of structures. (Barry R. Masters, Optics & Photonics News, April, 2012)

From the reviews: The authors have developed their course lecture notes into a useful book that is suitable for graduate students of materials science and engineering who use X-ray diffraction techniques. ... This book is a very concise presentation of the theory of scattering and diffraction and the determination of crystal structures. ... The biggest strength of this book are the solutions that illustrate the quantitative aspects of the subject. The illustrations complement the text and there are many tables of real diffraction data and calculations of structures. (Barry R. Masters, Optics & Photonics News, April, 2012)

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