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OverviewFull Product DetailsAuthor: David E. Root , Jan Verspecht , Jason Horn , Mihai MarcuPublisher: Cambridge University Press Imprint: Cambridge University Press Dimensions: Width: 17.80cm , Height: 1.50cm , Length: 25.20cm Weight: 0.630kg ISBN: 9780521193238ISBN 10: 0521193230 Pages: 233 Publication Date: 26 September 2013 Audience: College/higher education , Tertiary & Higher Education Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviews'This book is an excellent treatise by experts from Agilent on the assumption and use of x-parameters.' Alfy Riddle, IEEE Microwave Magazine Author InformationDavid E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011). Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE. Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements. Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling. Tab Content 6Author Website:Countries AvailableAll regions |
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