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OverviewWafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions. Full Product DetailsAuthor: Sudarshan Bahukudumbi , Krishnendu ChakrabartyPublisher: Artech House Publishers Imprint: Artech House Publishers Edition: Unabridged edition Dimensions: Width: 15.70cm , Height: 1.80cm , Length: 23.10cm Weight: 0.431kg ISBN: 9781596939899ISBN 10: 1596939893 Pages: 210 Publication Date: 28 February 2010 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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