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OverviewWritten by an award-winning leader in the field, this is a thoroughly integrated overview of the many facets and disciplines of optical scanning. Of particular utility to both practitioner and student are such features as: An overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture In-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacemen A comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation A unique focus on the Lagrange invariant and its revealing resolution invariant Full Product DetailsAuthor: Leo BeiserPublisher: John Wiley & Sons Inc Imprint: Wiley-Interscience Dimensions: Width: 16.20cm , Height: 1.90cm , Length: 24.20cm Weight: 0.435kg ISBN: 9780471316541ISBN 10: 0471316547 Pages: 185 Publication Date: 25 February 2003 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsIt will be of interest to graduate students as well as researchers and engineers. (Optik 117, 2006) It will be of interest to graduate students as well as researchers and engineers. (Optik 117 (2006)) Author InformationLEO BEISER retired recently as the president and research director of Leo Beiser Inc., a consulting and research company specializing in image and data scanning and recording for global clients including 3M, Agfa-Gevaert, Bell Labs, Boeing, Burroughs, Compugraphic, Kodak, Canon, General Electric, Polaroid, Scitex, and Xerox. Prior to that, as a staff researcher and project manager at CBS Laboratories, Autometric/Raytheon, Radio Receptor Corporation, and Polarad Electronics Corp., he pioneered formative advances in super-high resolution/speed image and data scanning and recording. An extensively published author and internationally renowned expert, Beiser has been recognized by his profession with numerous awards including the prestigious George W. Goddard Award from the International Society for Optical Engineering. Leo Beiser is Adjunct Professor in the Institute of Imaging Science, Polytechnic University, New York Tab Content 6Author Website:Countries AvailableAll regions |