Uncertainty Modelling and Quality Control for Spatial Data

Author:   Shi Wenzhong ,  Bo Wu ,  Alfred Stein
Publisher:   Taylor & Francis Inc
ISBN:  

9781498733281


Pages:   320
Publication Date:   24 November 2015
Format:   Hardback
Availability:   In Print   Availability explained
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Uncertainty Modelling and Quality Control for Spatial Data


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Overview

Offers New Insight on Uncertainty Modelling Focused on major research relative to spatial information, Uncertainty Modelling and Quality Control for Spatial Data introduces methods for managing uncertainties—such as data of questionable quality—in geographic information science (GIS) applications. By using original research, current advancement, and emerging developments in the field, the authors compile various aspects of spatial data quality control. From multidimensional and multi-scale data integration to uncertainties in spatial data mining, this book launches into areas that are rarely addressed. Topics covered include: New developments of uncertainty modelling, quality control of spatial data, and related research issues in spatial analysis Spatial statistical solutions in spatial data quality Eliminating systematic error in the analytical results of GIS applications A data quality perspective for GIS function workflow design Data quality in multi-dimensional integration Research challenges on data quality in the integration and analysis of data from multiple sources A new approach for imprecision management in the qualitative data warehouse A multi-dimensional quality assessment of photogrammetric and LiDAR datasets based on a vector approach An analysis on the uncertainty of multi-scale representation for street-block settlement Uncertainty Modelling and Quality Control for Spatial Data serves university students, researchers and professionals in GIS, and investigates the uncertainty modelling and quality control in multi-dimensional data integration, multi-scale data representation, national or regional spatial data products, and new spatial data mining methods.

Full Product Details

Author:   Shi Wenzhong ,  Bo Wu ,  Alfred Stein
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Dimensions:   Width: 15.60cm , Height: 2.30cm , Length: 23.40cm
Weight:   0.780kg
ISBN:  

9781498733281


ISBN 10:   149873328
Pages:   320
Publication Date:   24 November 2015
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Wenzhong Shi, Bo Wu, Alfred Stein

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