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Author:   Ludwig Reimer ,  Helmut Kohl
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of hardcover 5th ed. 2008
Volume:   36
Dimensions:   Width: 15.50cm , Height: 3.10cm , Length: 23.50cm
Weight:   0.920kg
ISBN:  

9781441923080

ISBN 10:   144192308
Pages:   590
Publication Date:   19 November 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron–Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ..- Imaging of Crystalline Specimens and Their Defects..- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy..- Specimen Damage by Electron Irradiation.

Reviews

From the reviews of the fifth edition: A classical monograph on the physics of image formation, electron-specimen interactions, and image interpretation in transmission electron microscopy. ! the student and the instructor can find applications of many fundamental concepts of physics in this book. ! could be used, of course by scientists in the field of transmission electron microscopy and by students attending a summer school on the technique. ! In conclusion, this book will probably be found in libraries and on the shelves of the expert in transmission electron microscopy ! . (Gary J. Long, Belgian Physical Society Magazine, Issue 1, 2011)

From the reviews of the fifth edition: A classical monograph on the physics of image formation, electron-specimen interactions, and image interpretation in transmission electron microscopy. ... the student and the instructor can find applications of many fundamental concepts of physics in this book. ... could be used, of course by scientists in the field of transmission electron microscopy and by students attending a summer school on the technique. ... In conclusion, this book will probably be found in libraries and on the shelves of the expert in transmission electron microscopy ... . (Gary J. Long, Belgian Physical Society Magazine, Issue 1, 2011)

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