Topological Disorder in Condensed Matter: Proceedings of the Fifth Taniguchi International Symposium, Shimoda, Japan, November 2–5, 1982

Author:   F. Yonezawa ,  T. Ninomiya
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   Softcover reprint of the original 1st ed. 1983
Volume:   46
ISBN:  

9783642821066


Pages:   256
Publication Date:   30 December 2011
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Topological Disorder in Condensed Matter: Proceedings of the Fifth Taniguchi International Symposium, Shimoda, Japan, November 2–5, 1982


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"This volume contains papers presented at the Fifth Taniguchi Symposium on the Theory of Condensed Matter, which was held between 2-5 November, 1982, at Shimoda, Japan. The topic of the Symposium was ""Topological Disorder in Condensed Matter. "" The objective of the Taniguchi Symposium is to encourage activity in those fields of research not in the limelight at the moment but regarded as very promising, such as our theme. Topological disorder refers to the dis­ order in the positions and connectivities of atoms in amorphous solids and liquids. The development of the physiCS of topologically disorderd systems, though extremely important fundamentally and for application purposes, falls far behind compared to that of other kinds of disorderd systems because the structure characterization of topologically disordered systems is still at a rather primitive stage. The structure characterization is the key to com­ prehensive understanding of physical properties of any material. Recently, several new attempts at structural analyses have been reported. Encouraged by this fact, our motivation in organizing the symposium was to investigate the possibilities of theoretical approaches to open a breakthrough in the present research situation on this subject. A rough sketch of the problem is made in the Introduction to give the readers a general outline of the subject. Part I is devoted to several at­ tempts to synthesize and characterize topological disorder more or less by analytical means."

Full Product Details

Author:   F. Yonezawa ,  T. Ninomiya
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 1st ed. 1983
Volume:   46
Dimensions:   Width: 15.50cm , Height: 1.40cm , Length: 23.50cm
Weight:   0.417kg
ISBN:  

9783642821066


ISBN 10:   3642821065
Pages:   256
Publication Date:   30 December 2011
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

I Structural Aspects of Topological Disorder.- Gauge Theory of Glass.- Change in Space Curvature Relation to Order and Disorder in Amorphous Structures.- Medium Range Order in Dense Random Packed Structure.- Random Two-Dimensional Cellular Structures.- Problems in a Digital Description of a Configuration of Atoms and Some Other Geometrical Topics in Physics.- II Computer Simulations and Analyses.- Computer Glass Transition.- Atomic Structure and Electronic State of Metallic Glasses.- III Some Aspects of Elementary Excitations.- Topology, Geometry, Elementary Excitations and Physical Properties of Disordered Materials.- Topological Disorder and Waves in a Dislocated Lattice.- Path Integral Formulation of Quantum Propagation in a Dislocated Lattice.- IV Statistical Properties in Two Dimensions.- Order, Frustration, and Two-Dimensional Glass.- Statistics of Two-Dimensional Amorphous Lattice and Some Applications.- Ordering Processes in Frustrated Systems.- Quantum Effects in Two-Dimensional X-Y Model.- Dynamics of Topological Disorder: Brownian Motion with Geometrical Restriction.- V Related Problems.- Dislocation Model of Liquids—Basic Concepts and Phenomena Related to Atomic Motion.- Macroscopic Response of Glassy Dielectrics: Long-Range Force and Local Randomness.- Summary of the Conference.- Index of Contributors.

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