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OverviewPhysics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the properties of various thin films materials and systems.In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films. Full Product DetailsAuthor: Ronald Powell (Novellus Systems, Inc., Palo Alto, California) , Maurice H. Francombe (Georgia State University, Atlanta, U.S.A.) , Abraham Ulman (Polytechnic University, Brooklyn, New York, U.S.A.) , Janet Perlman (Southwest Indexing)Publisher: Elsevier Science Publishing Co Inc Imprint: Academic Press Inc Volume: v. 25 Dimensions: Width: 15.20cm , Height: 3.00cm , Length: 22.90cm Weight: 0.850kg ISBN: 9780125330251ISBN 10: 0125330251 Pages: 526 Publication Date: 12 August 1998 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Out of Print Availability: In Print  Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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