Test Data Engineering: Latent Rank Analysis, Biclustering, and Bayesian Network

Author:   Kojiro Shojima
Publisher:   Springer Verlag, Singapore
Edition:   1st ed. 2022
Volume:   13
ISBN:  

9789811699887


Pages:   579
Publication Date:   15 August 2023
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Our Price $422.37 Quantity:  
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Test Data Engineering: Latent Rank Analysis, Biclustering, and Bayesian Network


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Overview

This is the first technical book that considers tests as public tools and examines how to engineer and process test data, extract the structure within the data to be visualized, and thereby make test results useful for students, teachers, and the society. The author does not differentiate test data analysis from data engineering and information visualization. This monograph introduces the following methods of engineering or processing test data, including the latest machine learning techniques: classical test theory (CTT), item response theory (IRT), latent class analysis (LCA), latent rank analysis (LRA), biclustering (co-clustering), and Bayesian network model (BNM). CTT and IRT are methods for analyzing test data and evaluating students’ abilities on a continuous scale. LCA and LRA assess examinees by classifying them into nominal and ordinal clusters, respectively, where the adequate number of clusters is estimated from the data. Biclustering classifies examinees into groups (latent clusters) while classifying items into fields (factors). Particularly, the infinite relational model discussed in this book is a biclustering method feasible under the condition that neither the number of groups nor the number of fields is known beforehand. Additionally, the local dependence LRA, local dependence biclustering, and bicluster network model are methods that search and visualize inter-item (or inter-field) network structure using the mechanism of BNM. As this book offers a new perspective on test data analysis methods, it is certain to widen readers’ perspective on test data analysis.  

Full Product Details

Author:   Kojiro Shojima
Publisher:   Springer Verlag, Singapore
Imprint:   Springer Verlag, Singapore
Edition:   1st ed. 2022
Volume:   13
Weight:   0.914kg
ISBN:  

9789811699887


ISBN 10:   9811699887
Pages:   579
Publication Date:   15 August 2023
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Concept of Test Data Engineering.- Test Data and Item Analysis.- Classical Test Theory.- Item Response Theory.- Latent Class Analysis.- Biclustering.- Bayesian Network Model.

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Author Information

Kojiro Shojima is Associate Professor at The National Center for University Entrance Examinations. He is a psychometrician living in Tokyo with his (lovely) wife and two (angelic) daughters.

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