Overview

An advanced textbook presenting the current state of electronics technology relying on surface and interface properties. Covers the fundamentals, measurements, characterization, and control techniques. With extensive reading lists, citations, and end-of-chapter problem sets.

Full Product Details

Author:   Leonard J. Brillson
Publisher:   Wiley-VCH Verlag GmbH
Imprint:   Wiley-VCH Verlag GmbH
Dimensions:   Width: 18.00cm , Height: 3.40cm , Length: 24.80cm
Weight:   1.226kg
ISBN:  

9783527409150

ISBN 10:   3527409157
Pages:   586
Publication Date:   10 March 2010
Audience:   College/higher education ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Preface 1. Introduction 2. Historical Background 3. Electrical Measurements 4. Interface states 5. Ultrahigh vacuum technology 6. Surface and interface analysis 7. Photoemission spectroscopy 8. Photoemission with soft X-rays 9. Particle-solid scattering 10. Electron energy loss spectroscopy 11. Rutherford backscattering spectrometry 12. Secondary ion mass spectrometry 13. Electron diffraction 14. Scanning tunneling microscopy 15. Optical spectroscopies 16. Cathodoluminescence spectroscopy 17. Electronic Materials' Surfaces 18. Adsorbates on Electronic Materials' Surfaces 19. Adsorbate-Semiconductor Sensors 20. Heterojunctions 21. Metals on semiconductors 22. The future of interfaces Appendices

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Author Information

Leonard Brillson is a professor of Electrical & Computer Engineering, Physics, and Center for Materials Research Scholar at The Ohio State University in Columbus, OH, USA. Prior to that, he was director of Xerox Corporation's Materials Research Laboratory and had responsibility for Xerox's long-range physical science and technology programs at the company's research headquarters in Rochester, N.Y. He is a Fellow of IEEE, AAAS, AVS, and APS, and a former Governing Board member of the American Institute of Physics. He has authored over 300 scientific publications and received numerous scientific awards, including the AVS Gaede-Langmuir Award.

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