Surface Wetting: Characterization, Contact Angle, and Fundamentals

Author:   Kock-Yee Law ,  Hong Zhao
Publisher:   Springer International Publishing AG
Edition:   1st ed. 2016
ISBN:  

9783319252124


Pages:   162
Publication Date:   25 November 2015
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Surface Wetting: Characterization, Contact Angle, and Fundamentals


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Overview

This book describes wetting fundamentals and reviews the standard protocol for contact angle measurements. The authors include a brief overview of applications of contact angle measurements in surface science and engineering. They also discuss recent advances and research trends in wetting fundamentals and include measurement techniques and data interpretation of contract angles.

Full Product Details

Author:   Kock-Yee Law ,  Hong Zhao
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   1st ed. 2016
Dimensions:   Width: 15.50cm , Height: 1.10cm , Length: 23.50cm
Weight:   3.849kg
ISBN:  

9783319252124


ISBN 10:   3319252127
Pages:   162
Publication Date:   25 November 2015
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

1.Background.- 2.Contact Angle Measurements and Surface Characterization Techniques.- 3.Wetting on Flat and Smooth Surfaces.- 4.Wetting on Rough Surfaces.- 5.What Do Contact Angles Measure?.- 6.Terminologies and Definitions.- 7 Determination of Solid Surface Tension by Contact Angle.- 8 Summary and Final Remarks.

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Author Information

Dr. Kock-Yee Law is a researcher in nanotechnology and surface design with over 120 peer-reviewed publications and 105 granted US patents to date. Dr. Hong Zhao is an Assistant Professor at Virginia Commonwealth University, School of Engineering, Mechanical, and Nuclear Engineering. 

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