Study on Yield Related Traits in Wheat

Author:   Obaidullah Khan
Publisher:   LAP Lambert Academic Publishing
ISBN:  

9783659489051


Pages:   100
Publication Date:   30 November 2013
Format:   Paperback
Availability:   In stock   Availability explained
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Study on Yield Related Traits in Wheat


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Overview

Need for the improvement in wheat yield is increasing continuously due to day by day increase in human population on the same land. This challenge is much greater in the developing countries than the developed world. Many breeding programs are based on selection of desirable parents for hybridization that's the main source to create genetic variation which is heritable to offspring. This study was carried out to have information on the magnitude of heritability and genetic advance of various important wheat parameters as it plays an important role for planning breeding strategy. For this purpose second filial (F2) generation of ten cross combinations involving seven wheat varieties/genotypes were studied. These were planted in field in a Randomized Complete Block Design with three replications. At maturity 200 plants from each cross and 20 plants from each parent were taken and data were recorded. The information derived will be very helpful to make improvement in wheat yield through reliable selection as it is suggested that varieties/genotypes showing good results should be given due importance in future breeding programs.

Full Product Details

Author:   Obaidullah Khan
Publisher:   LAP Lambert Academic Publishing
Imprint:   LAP Lambert Academic Publishing
Dimensions:   Width: 15.20cm , Height: 0.60cm , Length: 22.90cm
Weight:   0.159kg
ISBN:  

9783659489051


ISBN 10:   3659489050
Pages:   100
Publication Date:   30 November 2013
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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