Stress-induced Phenomena in Metallization: Third International Workshop

Author:   P. S. Ho ,  John Bravman ,  Che-Yu Li (Cornell University) ,  John Sanchez
Publisher:   American Institute of Physics
Volume:   v. 373
ISBN:  

9781563964398


Pages:   320
Publication Date:   15 April 1998
Format:   Hardback
Availability:   In Print   Availability explained
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Stress-induced Phenomena in Metallization: Third International Workshop


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Overview

This text is aimed at engineers and research scientists working in the fields of microelectronics and ma terials science. '

Full Product Details

Author:   P. S. Ho ,  John Bravman ,  Che-Yu Li (Cornell University) ,  John Sanchez
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Volume:   v. 373
Dimensions:   Width: 16.70cm , Height: 2.20cm , Length: 24.00cm
Weight:   0.620kg
ISBN:  

9781563964398


ISBN 10:   1563964392
Pages:   320
Publication Date:   15 April 1998
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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