Overview

From a September 1991 international workshop in Ithaca, New York, 18 papers address the growing concern over the impact of stress-induced voiding and related phenomena on reliability in very large scale integrated circuits, as the circuit features become ever smaller and challenge the capabilities o

Full Product Details

Author:   C. Y. Li ,  Paul A. Totta ,  P. S. Ho
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Volume:   v.263
Dimensions:   Width: 15.00cm , Height: 2.00cm , Length: 23.00cm
Weight:   0.610kg
ISBN:  

9781563960826

ISBN 10:   1563960826
Pages:   288
Publication Date:   27 March 1998
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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