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Author:   Jeffrey P. Simmons ,  Lawrence F. Drummy ,  Charles A. Bouman ,  Marc De Graef
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Weight:   1.088kg
ISBN:  

9781498738200

ISBN 10:   1498738206
Pages:   536
Publication Date:   06 February 2019
Audience:   College/higher education ,  General/trade ,  Tertiary & Higher Education ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

1 Materials Science vs. Data Science 2 Emerging Digital Data Capabilities 3 Cultural Differences 4 Forward Modeling 5 Inverse Problems and Sensing 6 Model-Based Iterative Reconstruction for Electron Tomography 7 Statistical reconstruction and heterogeneity characterization in 3-D biological macromolecular complexes 8 Object Tracking through Image Sequences 9 Grain Boundary Characteristics 10 Interface Science and the Formation of Structure 11 Hierarchical Assembled Structures from Nanoparticles 12 Estimating Orientation Statistics 13 Representation of Stochastic Microstructures 14 Computer Vision for Microstructure Representation 15 Topological Analysis of Local Structure 16 Markov Random Fields for Microstructure Simulation 17 Distance Measures for Microstructures 18 Industrial Applications 19 Anomaly Testing 20 Anomalies in Microstructures 21 Denoising Methods with Applications to Microscopy 22 Compressed Sensing for Imaging Applications 23 Dictionary Methods for Compressed Sensing 24 Sparse Sampling in Microscopy

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Jeffrey P. Simmons, Lawrence F. Drummy, Charles A. Bouman, Marc De Graef

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