Statistical Methods for Materials Science: The Data Science of Microstructure Characterization

Author:   Jeffrey P. Simmons ,  Lawrence F. Drummy ,  Charles A. Bouman ,  Marc De Graef
Publisher:   Taylor & Francis Ltd
ISBN:  

9780367780289


Pages:   514
Publication Date:   31 March 2021
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Statistical Methods for Materials Science: The Data Science of Microstructure Characterization


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Author:   Jeffrey P. Simmons ,  Lawrence F. Drummy ,  Charles A. Bouman ,  Marc De Graef
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   0.453kg
ISBN:  

9780367780289


ISBN 10:   0367780283
Pages:   514
Publication Date:   31 March 2021
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

1 Materials Science vs. Data Science 2 Emerging Digital Data Capabilities 3 Cultural Differences 4 Forward Modeling 5 Inverse Problems and Sensing 6 Model-Based Iterative Reconstruction for Electron Tomography 7 Statistical reconstruction and heterogeneity characterization in 3-D biological macromolecular complexes 8 Object Tracking through Image Sequences 9 Grain Boundary Characteristics 10 Interface Science and the Formation of Structure 11 Hierarchical Assembled Structures from Nanoparticles 12 Estimating Orientation Statistics 13 Representation of Stochastic Microstructures 14 Computer Vision for Microstructure Representation 15 Topological Analysis of Local Structure 16 Markov Random Fields for Microstructure Simulation 17 Distance Measures for Microstructures 18 Industrial Applications 19 Anomaly Testing 20 Anomalies in Microstructures 21 Denoising Methods with Applications to Microscopy 22 Compressed Sensing for Imaging Applications 23 Dictionary Methods for Compressed Sensing 24 Sparse Sampling in Microscopy

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Jeffrey P. Simmons, Lawrence F. Drummy, Charles A. Bouman, Marc De Graef

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