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OverviewOn-line and off-line quality control are the two methods used to discern a products reliability of quality. Though they are disparate techniques, both methods are used to achieve the same result. This introductory textbook integrates the two techniques to present a wide coverage of statistical methods of quality control. The text is compact, stressing the key ideas and concepts rather than trying to cover each method in complete depth. Statistical Aspects of Quality Control is an excellent starting point for a student interested in learning more about the field of statistical quality control. References and suggested readings are included at the end of each chapter. Full Product DetailsAuthor: Derman Cyrus (Columbia University) , Sheldon M. Ross (University of Southern California, Los Angeles, USA)Publisher: Elsevier Science & Technology Imprint: Academic Press Inc ISBN: 9781493300365ISBN 10: 1493300369 Pages: 200 Publication Date: 06 November 1996 Audience: College/higher education , Tertiary & Higher Education Format: Paperback Publisher's Status: Active Availability: In stock  We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsIntroduction.Elements of Probability.Statistical Inference.Off-Line Quality Control.Shewhart Control Charts.More General Control Charts.Sampling Inspection by Attributes.Sampling Inspection by Variables--A Loss FunctionApproach.Subject Index.ReviewsThe book is well written and easy to follow. -Enrique Del Castillo, University of Texas-Arlington, THE AMERICAN SATISTICIAN ...the book is useful to both statistician and nonstatistician audiences... -Robert O'Donnell, Hewlett-Packard, TECHNOMETRICS Author InformationTab Content 6Author Website:Countries AvailableAll regions |
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