Standards for Electronic Imaging Technologies, Devices and Systems
Author:   Michael C. Nier
Publisher:   SPIE Press
ISBN:  

9780819420169


Pages:   284
Publication Date:   30 June 1996
Format:   Paperback
Availability:   To order   Availability explained
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Standards for Electronic Imaging Technologies, Devices and Systems


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Overview

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Full Product Details

Author:   Michael C. Nier
Publisher:   SPIE Press
Imprint:   SPIE Press
Dimensions:   Width: 17.80cm , Height: 1.60cm , Length: 25.40cm
Weight:   0.494kg
ISBN:  

9780819420169


ISBN 10:   0819420166
Pages:   284
Publication Date:   30 June 1996
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

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