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OverviewFull Product DetailsAuthor: Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) , Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) , Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) , Milton Ohring (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))Publisher: Elsevier Science Publishing Co Inc Imprint: Academic Press Inc Dimensions: Width: 15.20cm , Height: 0.90cm , Length: 22.90cm Weight: 0.390kg ISBN: 9780125249980ISBN 10: 0125249985 Pages: 160 Publication Date: 13 January 2000 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Out of Print Availability: In Print  Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock. Table of ContentsReviewsAuthor InformationDr. Milton Ohring, author of two previously acclaimed Academic Press books,The Materials Science of Thin Films (l992) and Engineering Materials Science (1995), has taught courses on reliability and failure in electronics at Bell Laboratories (AT&T and Lucent Technologies). From this perspective and the well-written tutorial style of the book, the reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices; acquire skills in the mathematical handling of reliability data; and better appreciate future technology trends and the reliability issues they raise. Tab Content 6Author Website:Countries AvailableAll regions |
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