Overview

In this edition of Secondary Ion Mass Spectrometry (SIMS) and its Application to Material Science the authors expand further on the principles and methods presented in the first edition. A more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. In particular the development and application of cluster ion beams, and how this has opened up a new area of materials analysis. Practical information on how to obtain high quality SIMS data, and what parameters should be used to define this are also considered. Key Features: Update and significant extension compared to 1st edition New chapter on data analysis Accessible for students from different backgrounds Includes applications across materials,

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Sarah Fearn obtained her PhD from the Department of Materials, Imperial College in 2000. After working in commercial SIMS analysis for two years, she returned to academia in2002. Since then she has worked on a variety of research projects that have all applied SIMS as the main characterisation tool for understanding a range of material science issues such as glass corrosion, to calcium deposits in eye tissue. Over the last 20 years she has published ~90 papers spanning a wide range of material science issues and the application of SIMS. Since 2012 she has been in charge of the surface analysis laboratory in the Department of Materials at Imperial College.

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