Overview

"The publication entitled ""Surface Studies by Scanning Tunneling Mi­ Rl croscopy"" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab­ oratory in Riischlikon in 1982 immediately raised considerable interest in the sur­ face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri­ cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi­ mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image."

Full Product Details

Author:   H. Neddermeyer
Publisher:   Springer
Imprint:   Springer
Edition:   1993 ed.
Volume:   6
Weight:   0.640kg
ISBN:  

9780792320654

ISBN 10:   0792320654
Pages:   267
Publication Date:   30 April 1993
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Surface Studies by Scanning Tunneling Microscopy, Phys. Rev. Lett. (1982).- 7×7 Reconstruction on Si(111) Resolved in Real Space, Phys. Rev. Lett. (1983).- Scanning tunneling microscopy, IBM J. Res. Develop. (1986).- Atomic Force Microscope, Phys. Rev. Lett. (1986).- Theory of the scanning tunneling microscope, Phys. Rev. B (1985).- Voltage dependence of the tunneling current: an exact expression, J. Microscopy (1988).- Theory of Single-Atom Imaging in the Scanning Tunneling Microscope, Phys. Rev. Lett. (1986).- Scanning tunneling miscroscope combined with a scanning electron miscroscope, Rev. Sci. In-strum. (1986).- A simplified scanning tunneling miscroscope for surface science studies, J. Vac. Sci. Technol. A (1986).- Mono-atomic tips for scanning tunneling microscopy, IBM J. Res. Develop. (1986).- Tunneling Spectroscopy and Inverse Photoemission: Image and Field States, Phys. Rev. Lett. (1985).- Surface Electronic Structure of Si(111)-(7×7) Resolved in Real Space, Phys. Rev. Lett. (1986).- Voltage-dependent scanning tunneling microscopy imaging of semiconductor surfaces, J. Vac. Sci. Technol. A (1988).- Atomic-Resolution Imaging of Close-Packed Metal Surfaces by Scanning Tunneling Microscopy, Phys. Rev. Lett. (1989).- Determination of atom positions at stacking fault dislocations on Au(111) by scanning tunneling mi-croscopy, Phys. Rev. B (1989).- Scanning tunneling microscopy of Si(001), Phys. Rev. B (1986).- Electronic Structure of Localized Si Dangling-Bond Defects by Tunneling Spectroscopy, Phys. Rev. Lett. (1988).- Fermi-Level Pinning at the Sb/GaAs(110) Surface Studied by Scanning Tunneling Spectro-scopy, Phys. Rev. Lett. (1988).- Initial Stage of Ag Condensation on Si(111)7× 7, Phys. Rev. Lett. (1988).- Registration and Nucleation of theAg/Si(111)$$ Ag/Si(111)(\sqrt {3} \times \sqrt {3} )R30^\circ $$R30° Structure by Scanning Tunneling Mi-croscopy, Phys. Rev. Lett. (1987).- Arsenic-terminated silicon and germanium surfaces studied by scanning tunneling microscopy, J. Microscopy (1988).- Atom-resolved surface chemistry studied by scanning tunneling microscopy and spectroscopy, Phys. Rev. B (1989).- Voltage-dependent scanning tun-neling microscopy of a crystal surface: Graphite, Phys. Rev. B (1985).- Interatomic Forces in Scanning Tun-neling Microscopy: Giant Corrugations of the Graphite Surface, Phys. Rev. Lett. (1986).- Anomalous Corrugations in Scanning Tunneling Microscopy: Imaging of Individual States, Phys. Rev. Lett. (1986).- Scanning Tunneling Microscopy Observations of Benzene Molecules on the Rh(111)-(3x (C6 H6 2CO) Surface, Phys. Rev. Lett. (1988).- High-Resolution Imaging of Cop-per Phthalocyanine by Scanning Tunneling Microscopy, Phys. Rev. Lett. (1989).- Observation of Individual Organic Mo-lecules at a Crystal Surface with Use of a Scanning Tunneling Microscopy, Phys. Rev. Lett. (1988).- Scanning Tunneling Microscopy of recA-DNA Complexes Coated with a Conducting Film, Science (1988).- Scanning tunneling micro-scopy of biomacromolecules, J. Microscopy (1988).- Scanning Tunneling Microscopy of Processes at Liquid-Solid Interfaces, Surf. Sci. (1987).- In Situ Scanning Tunneling Microscope Observation of Roughening, Annealing and Dissolution of Gold (111) in an Electrochemical Cell, Phys. Rev. Lett. (1989).- Atomic Resolution with Atomic Force Microscope, Europhys. Lett. (1987).- High-resolution force micro-scopy of in-plane magnetization, J. Microscopy (1988).- Atomic-Scale Friction of a Tungsten Tip on Graphite Surface, Phys. Rev. Lett. (1987).- Spatial Variations in theSu-perconductivity of Nb3Sn Measured by Low-Temperature Tunnel-ing Microscopy, Phys. Rev. Lett. (1985).- Charge-density waves observed at 4.2 K by scanning tunneling microscopy, Phys. Rev. B (1988).- Scanning Tunneling Microscope Observation of the Abrikosov Flux Lattice and the Density of Sta-tes near and inside a Fluxoid, Phys. Rev. Lett. (1989).- Single electron effects observed with a low-temperature STM, J. Microscopy (1988).- Scanning tunneling potentiometry, Appl. Phys. Lett. (1986).- Atomic-scale surface modi-fications using a tunneling microscope, Nature (1987).- Surface modification in the nanometer range by the scanning tunneling microscope, J. Vac. Sci. Technol. A (1988).- Author Index.

Reviews

The selection of fields of application is impeccable, and the compilation makes very interesting reading, especially for newcomers to the field. ' Chemistry & Industry, 7 March 1994

The selection of fields of application is impeccable, and the compilation makes very interesting reading, especially for newcomers to the field.' Chemistry & Industry, 7 March 1994

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions