Overview

Nature is the best example of a system functioning on the nanometer scale, wherethematerialsinvolved,energyconsumption,anddatahandlingareop- mized. Opening the doors to the nanoworld, the emergence of the scanning tunneling microscope in 1982 and the atomic force microscope in 1986 led to a shift of paradigmin the understanding and perception of matter at its most fundamentallevel. As aconsequence,newrevolutionaryconceptsstimulateda number of new technologies. The current volume Scanning Probe Methods in Nanoscience and Nanotechnology showsthat these methods arestill making a tremendous impact on many disciplines that range from fundamental physics andchemistry throughinformationtechnology,spintronics,quantumcomp- ing, and molecular electronics, all the way to life sciences. Indeed, over 6,000 AFM-related papers were published in 2008 alone, bringing the total to more than 70,000 since its invention, according to the web of science, and the STM has inspired a total of 20,000 papers. There are also more than 500 patents related to the various forms of scanning probe microscopes. Commerciali- tion of the technology started at the end of the 1980s, and approximately 12,000 commercial systems have been sold so far to customers in areas as diverse as fundamental research,the car industry, and even the fashion ind- try. There are also a signi?cant number of home-built systems in operation. Some60-80companiesareinvolvedinmanufacturingSPMandrelatedinst- ments. Indeed, not even the sky seems to be the limit for AFM technology. TheRosettamissiontocomet67Plaunchedbythe EuropeanSpaceAgencyin 2004 includes an AFM in its MIDAS (Micro-Imaging Dust Analysis System) instrument.

Full Product Details

Author:   Bharat Bhushan
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2010 ed.
Dimensions:   Width: 15.50cm , Height: 4.30cm , Length: 23.50cm
Weight:   1.640kg
ISBN:  

9783642035340

ISBN 10:   3642035345
Pages:   956
Publication Date:   05 March 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock  
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Table of Contents

Scanning Probe Microscopy Techniques.- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids.- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy.- Polarization-Sensitive Tip-Enhanced Raman Scattering.- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes.- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics.- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity.- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter.- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope.- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy.- Characterization.- Simultaneous Topography and Recognition Imaging.- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM.- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules.- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices.- Quantized Mechanics of Nanotubes and Bundles.- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials.- Mechanical Properties of One-Dimensional Nanostructures.- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale.- Controlling Wear on Nanoscale.- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping.- Industrial Applications.- Modern Atomic Force Microscopy and Its Application to the Studyof Genome Architecture.- Near-Field Optical Litography.- A New AFM-Based Lithography Method: Thermochemical Nanolithography.- Scanning Probe Alloying Nanolithography.- Structuring the Surface of Crystallizable Polymers with an AFM Tip.- Application of Contact Mode AFM to Manufacturing Processes.- Scanning Probe Microscopy as a Tool Applied to Agriculture.

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