Scanning Probe Microscopy in Nanoscience and Nanotechnology

Author:   Bharat Bhushan
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   Softcover reprint of the original 1st ed. 2010
ISBN:  

9783662502204


Pages:   956
Publication Date:   23 August 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Scanning Probe Microscopy in Nanoscience and Nanotechnology


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Overview

1. Dynamic Force Microscopy and Spectroscopy using the Frequency-Modulation Technique in Air and Liquids.- 2. Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale.- 3. Scanning Probe Alloying Nanolithography.- 4. Controlling Wear on Nanoscale.- 5. Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM.- 6. Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture.- 7. Near-field Nanolitography.- 8. Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy.- 9. Simultaneous Topography and Recognition Imaging.- 10. Application of Contact Mode AFM to Manufacturing Processes.- 11. Mechanical Properties of One-dimensional Nanostructures.- 12. Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping.- 13. Force-extension (FX) and Force-clamp (FC) AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical properties of Single Biomolecules.- 14. Scanning Probe Microscopy as a Tool Applied to Agriculture.- 15. Spin Charge Pairing Instabilities, Magnetism and Ferroelectricity in Nanoclusters, High-Tc Cuprates, Manganites and Multiferroic Nanomaterials.- 16. Combining Atomic Force Microscopy and Depth Sensing Instruments for the Nanometre Scale Mechanical Characterization of Soft Matter.- 17. Structuring the Surface of Crystallizable Polymers with an AFM Tip.- 18. Polarization-sensitive Tip-enhanced Raman Scattering.- 19. Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope.- 20. Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics.- 21. Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices.- 22. A New AFM Based Lithography Method: ThermoChemical NanoLithography.- 23. Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity.- 24. Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes.- 25. Quantized Mechanics of Nanotubes and Bundles.- 26. Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy.

Full Product Details

Author:   Bharat Bhushan
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 1st ed. 2010
Weight:   1.988kg
ISBN:  

9783662502204


ISBN 10:   3662502208
Pages:   956
Publication Date:   23 August 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Scanning Probe Microscopy Techniques.- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids.- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy.- Polarization-Sensitive Tip-Enhanced Raman Scattering.- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes.- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics.- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity.- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter.- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope.- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy.- Characterization.- Simultaneous Topography and Recognition Imaging.- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM.- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules.- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices.- Quantized Mechanics of Nanotubes and Bundles.- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials.- Mechanical Properties of One-Dimensional Nanostructures.- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale.- Controlling Wear on Nanoscale.- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping.- Industrial Applications.- Modern Atomic Force Microscopy and Its Application to the Studyof Genome Architecture.- Near-Field Optical Litography.- A New AFM-Based Lithography Method: Thermochemical Nanolithography.- Scanning Probe Alloying Nanolithography.- Structuring the Surface of Crystallizable Polymers with an AFM Tip.- Application of Contact Mode AFM to Manufacturing Processes.- Scanning Probe Microscopy as a Tool Applied to Agriculture.

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