Scanning Electron Microscopy: Physics of Image Formation and Microanalysis

Author:   P.W. Hawkes ,  Ludwig Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   Softcover reprint of the original 2nd ed. 1998
Volume:   45
ISBN:  

9783642083723


Pages:   529
Publication Date:   01 December 2010
Replaced By:   9783540853176
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis


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Author:   P.W. Hawkes ,  Ludwig Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 2nd ed. 1998
Volume:   45
Dimensions:   Width: 15.50cm , Height: 2.70cm , Length: 23.50cm
Weight:   0.825kg
ISBN:  

9783642083723


ISBN 10:   3642083722
Pages:   529
Publication Date:   01 December 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Replaced By:   9783540853176
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM. T Mulvey, Measurement Science and Technology. 11, No12, December 2000


...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM. T Mulvey, Measurement Science and Technology. 11, No12, December 2000


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