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OverviewFull Product DetailsAuthor: Tom R Thomas (Avalon Technology, Uk)Publisher: Imperial College Press Imprint: Imperial College Press Edition: 2nd Revised edition Dimensions: Width: 16.50cm , Height: 2.00cm , Length: 22.90cm Weight: 0.522kg ISBN: 9781860941009ISBN 10: 1860941001 Pages: 296 Publication Date: 29 December 1998 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Awaiting stock The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you. Table of ContentsPart 1 Measurement: stylus instruments; optical techniques; other measurement techniques. Part 2 Characterization: profile characterization; area characterization; rough surfaces as fractals. Part 3 Applications: contact mechanics; tribology; other applications.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |