Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Author:   Chandra Shakher Pathak ,  Samir Kumar
Publisher:   IntechOpen
ISBN:  

9781839682292


Pages:   274
Publication Date:   07 January 2022
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Our Price $307.91 Quantity:  
Add to Cart

Share |

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization


Add your own review!

Overview

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

Full Product Details

Author:   Chandra Shakher Pathak ,  Samir Kumar
Publisher:   IntechOpen
Imprint:   IntechOpen
ISBN:  

9781839682292


ISBN 10:   1839682299
Pages:   274
Publication Date:   07 January 2022
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

Aorrng

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now