Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements
Author:   Jan Iwanczyk (DxRay Inc., USA.) ,  Krzysztof Iniewski
Publisher:   Taylor & Francis Ltd
Edition:   2nd edition
ISBN:  

9780367707170


Pages:   323
Publication Date:   27 May 2024
Format:   Paperback
Availability:   Not yet available   Availability explained
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Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements


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Author:   Jan Iwanczyk (DxRay Inc., USA.) ,  Krzysztof Iniewski
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Edition:   2nd edition
Weight:   0.453kg
ISBN:  

9780367707170


ISBN 10:   0367707179
Pages:   323
Publication Date:   27 May 2024
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Not yet available   Availability explained
This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release.

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Jan Iwanczyk is a consultant to Universities and private companies since July 2017. He has served as a President and CEO of DxRay, Inc., Northridge, California, from 2005 to 2017. Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications.

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