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OverviewThis book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography. Full Product DetailsAuthor: David S. Simon , Gregg Jaeger , Alexander V. SergienkoPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: Softcover reprint of the original 1st ed. 2017 Dimensions: Width: 15.50cm , Height: 1.50cm , Length: 23.50cm Weight: 0.454kg ISBN: 9783319835402ISBN 10: 3319835408 Pages: 273 Publication Date: 04 July 2018 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationDavid Simon. Professor, Stonehill College, Easton MA 02357, USA Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA Alexander V. Sergienko, Boston University, Boston MA 02215, USA Tab Content 6Author Website:Countries AvailableAll regions |
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