Overview

This volume provides coverage of the field of quantitative beam analysis. It covers the latest techniques for the determination of chemical composition based on the analysis of emitted radiations obtained from the bombardment of micrometre and submicrometre areas of solids with ions, electrons, X-rays and laser beams. Both practical and theoretical aspects of the subject are covered in detail. The contributors cover such topics as surface analytical techniques of Auger electron spectroscopy, X-ray photoelectron spectroscopy and secondary ion mass spectroscopy, as well as accelerated ion beam analysis techniques. Emphasis is placed on the comparison of the various techniques and the use of computer programs in the analysis of results.

Full Product Details

Author:   A.G Fitzgerald ,  B.E Storey (University of Dundee, UK) ,  D.J Fabian (University of Dundee, UK) ,  P. Osborne
Publisher:   Taylor & Francis Ltd
Imprint:   Institute of Physics Publishing
Volume:   40
Dimensions:   Width: 15.60cm , Height: 2.60cm , Length: 23.40cm
Weight:   0.952kg
ISBN:  

9780750302562

ISBN 10:   0750302569
Pages:   350
Publication Date:   01 January 1993
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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