Overview

"IWPTS'95 (International Workshop on Protocol Test Systems) is being held this year at !NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS'95 is the eighth of a series of annual meetings sponsored by the IFIP Working Group WG6.1 dedicated to ""Architecture and Protocols for Computer Networks"". The seven previous workshops were held in Vancouver (Canada, 1988), Berlin (Germany, 1989), Mclean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992), Pau (France, 1993) and Tokyo (Japan, 1994). The workshop is a meeting place where both research and industry, theory and practice come together. By bringing both researchers and practitioners together, IWPTS opens up the communication between these groups. This helps keep the research vital and improves the state of the practitioner's art. Forty-eight papers have been submitted to IWPTS'95 and all of them have been reviewed by the members of the Program Committee and additional reviewers. The completed reviewers list is included in this Proceedings. Based on these reviews, the Program Committee selected 26 for oral presentation and 4 to be presented as posters. Two specially invited papers complete the Workshop Program, which is composed of ten sessions: Testing Methods (Session 1), Test Environments (Session 2), Theoretical Framework (Session 3), Algorithms and Languages (Session 4), Test Generation 1 (Session 5), Testability (Session 6), Test Generation 2 (Session 7), Industrial Applications (Session 8), Distributed Testing and performance (Session 9) and Test Management (Session 10)."

Full Product Details

Author:   Ana Cavalli ,  Stan Budkowski
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 1996
Dimensions:   Width: 15.50cm , Height: 2.40cm , Length: 23.50cm
Weight:   0.712kg
ISBN:  

9781475763126

ISBN 10:   1475763123
Pages:   452
Publication Date:   27 February 2013
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
We will order this item for you from a manufactured on demand supplier.

Table of Contents

1 Testing through the ages.- 2 An executable protocol test sequence generation method for EFSM-specified protocols.- 3 Transformation of Estelle modules aiming at test case generation.- 4 Application of a LOTOS based test environment on AAL5.- 5 Stable testers for environment sensitive systems.- 6 Timed systems behaviour and conformance testing — a mathematical framework.- 7 An adaptative test sequence generation method for the users needs.- 8 A framework for testing telecommunication services.- 9 Conformance testing of protocols specified as labeled transition systems.- 10 Two approaches linking test generation with verification techniques.- 11 PROSPECT — a proposal for a new test specification language and its implementation.- 12 Test sequence generation for adaptive interoperability testing.- 13 Fault-tolerant UIO sequences in finite state machines.- 14 Guaranteeing full fault coverage for UIO-based testing methods.- 15 Towards testable communication software.- 16 Design for testability of protocols based on formal specifications.- 17 On the design for testability of communication protocols.- 18 A unified test case generation method for the EFSM model using context independent unique sequences.- 19 Handling redundant and additional states in protocol testing.- 20 Experiences with the design of B-ISDN integrated test system (BITS).- 21 The testing of BTs intelligent peripheral using abstract test suites from ETSI.- 22 Design of intelligent OSI protocol monitor.- 23 Management and maintenance of TTCN abstract test suites.- 24 Port-synchronizable test sequences for communication protocols.- 25 Synchronizable and checking sequences based on UIO sequences.- 26 Specification-driven performance monitoring of SDL/MSC-specified protocols.- 27 Test management and TTCNbased test sequencing.- 28 Towards a ‘practical formal method’ for test derivation.- Index of contributors.- Keyword index.

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