Properties of Crystalline Materials by X-ray Diffraction Methods and Symmetry Groups: A Practical Approach

Author:   John Fernando Zapata Mesa (Institución Universitaria de Envigado, Colombia)
Publisher:   Taylor & Francis Ltd
ISBN:  

9781032382371


Pages:   298
Publication Date:   30 September 2025
Format:   Hardback
Availability:   Not yet available   Availability explained
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Properties of Crystalline Materials by X-ray Diffraction Methods and Symmetry Groups: A Practical Approach


Overview

This book is a fundamental work for those seeking to understand the structure and properties of crystalline materials from a rigorous and systematic approach. Its coverage, which ranges from the physical principles of X-rays to structural refinement using the Rietveld method, provides a solid theoretical and practical foundation. The inclusion of symmetry group analysis and the study of elasticity reinforce its value in areas such as electronics and engineering. With an educational and precise approach, this work becomes an indispensable reference for materials characterization.

Full Product Details

Author:   John Fernando Zapata Mesa (Institución Universitaria de Envigado, Colombia)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   0.740kg
ISBN:  

9781032382371


ISBN 10:   1032382376
Pages:   298
Publication Date:   30 September 2025
Audience:   Adult education ,  Further / Higher Education
Format:   Hardback
Publisher's Status:   Active
Availability:   Not yet available   Availability explained
This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release.

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John Fernando Zapata Mesa has a B.Sc. in theoretical physics, an M.Sc. in elementary particle physics, and a Ph.D. in materials engineering. He completed his postdoctoral stay in quantum mechanics, addressing the problem of quantum confinement in semiconductor heterostructures. He obtained all degrees at the University of Antioquia, Medellín, Colombia. He has been working at the University of Envigado for 17 years and is a full professor attached to the Faculty of Engineering. His most recent research deals with the characterization of cementitious materials, the study of confinement in semiconductor heterostructures, and the modeling and simulation of physical phenomena at the macro and microstructure level and at the quantum level. Now he focuses on the study of the properties of materials from the study of their symmetries in the case of crystalline materials and methods of quantification of the amorphous phase in non-crystalline materials. For this purpose, he uses artificial intelligence tools, and tools such as the modified Rietveld method, FTIR modeling and Raman spectroscopy complemented with thermal analysis methods such as DSC and TGA techniques.

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