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OverviewThis book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Full Product DetailsAuthor: Amir Afshar (National Semiconductor)Publisher: Elsevier Science & Technology Imprint: Newnes (an imprint of Butterworth-Heinemann Ltd ) Dimensions: Width: 15.20cm , Height: 1.40cm , Length: 23.50cm Weight: 0.600kg ISBN: 9780750694728ISBN 10: 0750694726 Pages: 350 Publication Date: 22 April 1996 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Out of Print Availability: In Print  Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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