Free Delivery Over $100
|
|
|||
|
||||
OverviewFull Product DetailsAuthor: Micheal A.P. Pertijs , Johan HuijsingPublisher: Springer Imprint: Springer Edition: Softcover reprint of hardcover 1st ed. 2006 Dimensions: Width: 15.50cm , Height: 1.60cm , Length: 23.50cm Weight: 0.486kg ISBN: 9789048173259ISBN 10: 9048173256 Pages: 292 Publication Date: 25 November 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Out of print, replaced by POD  We will order this item for you from a manufatured on demand supplier. Table of ContentsAcknowledgment.- 1. Introduction.- 2. Characteristics of Bipolar Transistors.- 3. Ratiometric Temperature Measurement Using Bipolar Transistors.- 4. Sigma-Delta Analog-To-Digital Conversion.- 5. Precision Circuit Techniques.- 6. Calibration Techniques.- 7. Realizations.- 8. Conclusions.- Appendices. A Derivation of Mismatch-Related Errors. A.1 Errors in DVBE B Resolution Limits of Sigma-Delta Modulators with a DC Input. C Non-Exponential Settling Transients.- About the Authors.- Index.ReviewsAuthor Information"Prof. Johan Huijsing has (co) authored and edited over 20 books with Springer / Kluwer. Dr. Michiel Pertijs graduated ""cum laude"" for his PhD work on the Temperature Sensor" Tab Content 6Author Website:Countries AvailableAll regions |
||||
