Overview

This book will provide readers with a good overview of some of most recent advances in the field of Photon Counting CT technology for X-ray medical imaging, especially as it pertains to new detectors. There will be a good mixture of general chapters in both technology and applications in CT medical imaging. The book will have an in-depth review of the research topics from world-leading specialists in the field. The conversion of the X-ray signal into analogue/digital value will be covered in some chapters. The authors also provide a review of CMOS chips for X-ray image sensors, methods of material discrimination and image reconstruction techniques. Covers a broad range of topics, including an introduction to novel spectral Computed Tomography; Includes in-depth analysis on how to optimize X-ray detection; Discusses analysis of electronics for X-ray detection.

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9783031260643

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Scott Hsieh is an assistant professor at the Mayo Clinic whose research includes modeling and development of photon counting detectors. His past contributions to photon counting include theory for circuit designs that could reduce dose and improve contrast, and simulations to define application requirements. Previously, he was a faculty member at UCLA and an instructor at Stanford. He is a named inventor on 13 issued U.S. utility patents. Krzysztof (Kris) Iniewski is a director of detector architecture and applications at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 16 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. He has published over 150+ research papers in international journals and conferences. He holds 25+international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer.

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