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OverviewFull Product DetailsAuthor: Matthias Rudolph , Christian Fager (Chalmers University of Technology Chalmers University of Technology, Gothenberg) , David E RootPublisher: Not Avail Imprint: Not Avail ISBN: 9786613342355ISBN 10: 6613342351 Pages: 376 Publication Date: 31 October 2011 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: In stock  We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsWithout accurate component models, even the most powerful circuit simulator cannot provide meaningful results. The old saying, 'Junk in-Junk out, ' summarizes the process. The textbook, Nonlinear Transistor Model Parameter Extraction Techniques, contains a wealth of theoretical and practical information. It should be read by every active RF/Microwave circuit and as well as device designer. Les Besser, Author of COMPACT and Founder of Besser Associates Author InformationTab Content 6Author Website:Countries AvailableAll regions |
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