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OverviewDespite its continuing popularity, the so-called standard circuit model of compound semiconductor field-effect transistors (FETs) and high electron mobility transistors (HEMTs) is shown to have a limitation for nonlinear analysis and design: it is valid only in the static limit. When the voltages and currents are time-varying, as they must be for these devices to have any practical use, the model progressively fails for higher specification circuits. This book shows how to reform the standard model to render it fully compliant with the way FETs and HEMTs actually function, thus rendering it valid dynamically. Proof-of-principle is demonstrated for several practical circuits, including a frequency doubler and amplifiers with demanding performance criteria. Methods for extracting both the reformulated model and the standard model are described, including a scheme for re-constructing from S-parameters the bias-dependent dynamic (or RF) I(V) characteristics along which devices work in real-world applications, and as needed for the design of nonlinear circuits using harmonic-balance and time-domain simulators. The book includes a historical review of how variations on the standard model theme evolved, leading up to one of the most widely used-the Angelov (or Chalmers) model. Full Product DetailsAuthor: Peter LadbrookePublisher: Artech House Publishers Imprint: Artech House Publishers Edition: Unabridged edition Dimensions: Width: 17.80cm , Height: 2.80cm , Length: 25.40cm Weight: 0.907kg ISBN: 9781630818685ISBN 10: 1630818682 Pages: 480 Publication Date: 30 November 2021 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsIntroduction; Summary of approaches and needs; Practical behavior of FETs; The standard model: deriving the elements; The capacitance puzzle in the standard model; Dynamic I(V) measurementsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |