New Methods of Concurrent Checking

Author:   Michael Gössel ,  Vitaly Ocheretny ,  Egor Sogomonyan ,  Daniel Marienfeld
Publisher:   Springer
Edition:   Softcover reprint of hardcover 1st ed. 2008
Volume:   42
ISBN:  

9789048178766


Pages:   182
Publication Date:   28 October 2010
Format:   Paperback
Availability:   In Print   Availability explained
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New Methods of Concurrent Checking


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Overview

Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.

Full Product Details

Author:   Michael Gössel ,  Vitaly Ocheretny ,  Egor Sogomonyan ,  Daniel Marienfeld
Publisher:   Springer
Imprint:   Springer
Edition:   Softcover reprint of hardcover 1st ed. 2008
Volume:   42
Dimensions:   Width: 15.50cm , Height: 1.00cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9789048178766


ISBN 10:   9048178762
Pages:   182
Publication Date:   28 October 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Physical Faults and Functional Errors.- Principles of Concurrent Checking.- Concurrent Checking for the Adders.

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