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OverviewThe comprehensive reference and textbook serves as a timely, practical introduction to the principles of nanotribology and nanomechanics. Assuming some familiarity with macroscopic tribology, the book comprises chapters by internationally recognized experts, who integrate knowledge of the field from the mechanics and materials-science perspectives. They cover key measurement techniques, their applications, and theoretical modelling of interfaces, each beginning their contributions with macro- and progressing to microconcepts. Full Product DetailsAuthor: Bharat BhushanPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Edition: 2011 ed. Dimensions: Width: 15.50cm , Height: 3.30cm , Length: 23.50cm Weight: 0.973kg ISBN: 9783642427992ISBN 10: 3642427995 Pages: 623 Publication Date: 23 November 2014 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction - Measurement Techniques and Applications.- Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes.- General and Special Probes in Scanning Microscopies.- Force Calibration Techniques for AFM Cantilevers.- Noncontact Atomic Force Microscopy and Related Topics.- Low Temperature Scanning Probe Microscopy.- Dynamic Modes of Atomic Force Microscopy.- Molecular Single Molecular Recognition Force Spectroscopy and Imaging.- Nanomechanical Properties of Solid Surfaces and Thin Films.- Computer Simulations of Nanometer-Scale Indentation and Friction.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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