More How to Win at Aptitude Tests

Author:   Liam Healy
Publisher:   HarperCollins Publishers
ISBN:  

9780007112579


Pages:   224
Publication Date:   03 September 2001
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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More How to Win at Aptitude Tests


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Overview

A key guide to the latest developments in assessment and aptitude testing. Aptitude tests – also known as psychometric or IQ tests – are being relied on more and more by employers, schools and colleges. This book clearly explains how to be prepared for every aspect of the aptitude tests as well as tips on handling follow-up interviews. It incorporates new graduate and managerial level tests, as well as up-to-date information on internet-based methods of selection. More How To Win At Aptitude Tests is an essential aid for anyone faced with an aptitude or psychometric test. Includes: How to Boost your Numerical ability • Improve your Verbal, Abstract and Spatial reasoning • Increase your Speed and Accuracy. • Answers are supplied for every test. Healy explains how to best prepare for the test and what to expect from the session itself, as well as the follow-up/validation interview.

Full Product Details

Author:   Liam Healy
Publisher:   HarperCollins Publishers
Imprint:   Thorsons
Dimensions:   Width: 11.10cm , Height: 1.20cm , Length: 17.80cm
Weight:   0.121kg
ISBN:  

9780007112579


ISBN 10:   0007112572
Pages:   224
Publication Date:   03 September 2001
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Author Information

Liam Healy is an occupational psychologist. He publishes psychometric tests for major organizations and has pioneered the use of the internet for psychometric assessment and career development work for blue-chip clients all over the world.

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