Overview

This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.

Full Product Details

Author:   Valeria Teppati (Swiss Federal University (ETH), Zürich) ,  Andrea Ferrero (Politecnico di Torino) ,  Mohamed Sayed
Publisher:   Cambridge University Press
Imprint:   Cambridge University Press
Dimensions:   Width: 17.90cm , Height: 3.00cm , Length: 25.40cm
Weight:   1.000kg
ISBN:  

9781107036413

ISBN 10:   1107036410
Pages:   471
Publication Date:   20 June 2013
Audience:   Professional and scholarly ,  Professional and scholarly ,  Professional & Vocational ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand  
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Part I. General Concepts: 1. Transmission lines and scattering parameters Roger Pollard and Mohamed Sayed; 2. Microwave interconnections, probing, and fixturing Leonard Hayden; Part II. Microwave Instrumentation: 3. Microwave synthesizers Alexander Chenakin; 4. Real-time spectrum analysis and time-correlated measurements applied to non-linear system characterization Marcus Da Silva; 5. Vector network analyzers Mohamed Sayed and Jon Martens; 6. Microwave power measurements Ronald Ginley; 7. Modular systems for RF and microwave measurements Jin Bains; Part III. Linear Measurements: 8. Two-port network analyzer calibration Andrea Ferrero; 9. Multiport and differential S-parameter measurements Valeria Teppati and Andrea Ferrero; 10. Noise figure characterization Nerea Otegi, Juan-Mari Collantes and Mohamed Sayed; 11. TDR based S-parameters Peter J. Pupalaikis and Kaviyesh Doshi; Part IV. Non-Linear Measurements: 12. Vector network analysis for nonlinear systems Yves Rolain, Gerd Vandersteen and Maarten Schoukens; 13. Load and source-pull techniques Valeria Teppati, Andrea Ferrero and Gian Luigi Madonna; 14. Broadband signal measurements for linearity optimization Marco Spirito and Mauro Marchetti; 15. Pulse and RF measurement Anthony Parker.

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Author Information

Valeria Teppati is a Researcher in the Millimeter Wave Electronics Group of the Department of Information Technology and Electrical Engineering at ETH Zurich, developing innovative solutions to aspects of linear and non-linear measurement techniques. Andrea Ferrero is a Professor in the RF, Microwave and Computational Electronics group of the Department of Electronics and Telecommunications at Politecnico di Torino. He is a Distinguished Microwave Lecturer of the IEEE Microwave Theory and Techniques Society, and a Fellow of the IEEE. Mohamed Sayed is the Principal Consultant for Microwave and Millimeter Wave Solutions and has nearly 30 years' experience of developing microwave and millimetre wave systems for Hewlett-Packard Co. and Agilent Technologies Inc.

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