Overview

This important review series began in 1954 at Academic Press. The latest volume deals with scanning tunneling microscopy, the nickel oxide electrode, radioactive labeling as an in situ method of characterization of solid/liquid interfaces, metallic glasses, reaction kinetics and mechanisms, and DC r

Full Product Details

Author:   John O'M. Bockris ,  Brian E. Conway ,  Ralph E. White
Publisher:   Springer Science+Business Media
Imprint:   Kluwer Academic/Plenum Publishers
Edition:   1990 ed.
Volume:   21
Dimensions:   Width: 15.60cm , Height: 2.20cm , Length: 23.40cm
Weight:   1.440kg
ISBN:  

9780306433139

ISBN 10:   0306433133
Pages:   322
Publication Date:   28 February 1990
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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