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OverviewMicrowave/RF Applicators and Probes for Material Heating, Sensing, and Plasma Generation, Second Edition, encompasses the area of high-frequency applicators and probes for material interactions as an integrated science. Based on practical experience rather than entirely on theoretical concepts, and emphasizing phenomenological explanations and well-annotated figures, the book represents one of the most important resources on the topics of microwave technologies, applications of RF and microwaves in industry (industrial heating and drying), and microwave engineering. After covering the basics of field-material interactions, the book reviews and categorizes probes and applicators, demonstrates their real-world applications, and offers numerically solved examples. Readers will find valuable design rules and principles of high-frequency applicators and probes for material processing and sensing applications in this expanded edition. Full Product DetailsAuthor: Mehrdad Mehdizadeh (senior member of IEEE and the IEEE Standards Committee.) , Mehrdad Mehdizadeh (Principal Investigator, DuPont Company, USA)Publisher: William Andrew Publishing Imprint: William Andrew Publishing Edition: 2nd edition Dimensions: Width: 19.10cm , Height: 2.50cm , Length: 23.50cm Weight: 1.090kg ISBN: 9780323322560ISBN 10: 0323322565 Pages: 440 Publication Date: 18 September 2015 Audience: Professional and scholarly , Professional & Vocational Replaced By: 9780443365904 Format: Hardback Publisher's Status: Active Availability: Manufactured on demand We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationMehrdad Mehdizadeh earned his PhD in electrical engineering at Marquette University in 1983, with specialty in RF/microwave design. After working as an R&D engineer, first in microwave components industry then in MRI scanner RF design, he then joined DuPont Company Engineering working on RF/microwave processes and sensors for materials, plus high-frequency materials characterization. He is a senior member of IEEE and the IEEE Standards Committee. Tab Content 6Author Website:Countries AvailableAll regions |