Microwave Scattering and Emission Models and Applications

Author:   Adrian K. Fung
Publisher:   Artech House Publishers
ISBN:  

9780890065235


Pages:   592
Publication Date:   28 February 1994
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Microwave Scattering and Emission Models and Applications


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Overview

This book is intended for practitioners and applied researchers in remote sensing applications and also for graduate students in the field. This reference provides a surface scattering model covering the entire frequency axis instead of only high- or low-frequency models. The text includes extensive model behaviours and case studies and demonstrates the effectiveness of combining the models and neural networks to classify and retrieve terrain and rough surface parameters.

Full Product Details

Author:   Adrian K. Fung
Publisher:   Artech House Publishers
Imprint:   Artech House Publishers
Dimensions:   Width: 15.20cm , Height: 3.60cm , Length: 22.90cm
Weight:   1.034kg
ISBN:  

9780890065235


ISBN 10:   0890065233
Pages:   592
Publication Date:   28 February 1994
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

First-order radiative transfer solution; first-order radiative transfer solution passive sensing; formulation of the surface scattering problem; surface model and special cases; ranges validity of the IEM model; matrix doubling formulations for scattering and emission; scattering and emissions models for snow and sea ice; comparisons of model predictions with backscattering and emission measurements from snow and ice.

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