Microwave Circuit Theory and Foundations of Microwave Metrology

Author:   Glenn F. Engen
Publisher:   Institution of Engineering and Technology
Edition:   illustrated edition
Volume:   No. 9
ISBN:  

9780863412875


Pages:   256
Publication Date:   30 June 1992
Format:   Hardback
Availability:   In Print   Availability explained
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Microwave Circuit Theory and Foundations of Microwave Metrology


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Overview

"As suggested by the title, the book is divided into two major parts, microwave circuit theory, which includes chapters 1-9, and microwave metrology which comprises the remainder. The introductory chapters (primarily Chapter 2) are intended to provide a simplified outline of the theoretical basis for microwave (as contrasted with low frequency) circuit theory. These are based to a large degree upon the prior work of D.M. Kerns, whose example of careful formulation has been a source of unending challenge and inspiration to the author. Following this, the focus shifts to a development of the scattering notation, and where special attention is given to those features which make microwave metrology different from its lower frequency counterpart. The second part of the book describes the different experimental strategies which have been devised to measure the parameters associated with the microwave model. From one perspective, some of these are now ""obsolete"" by virtue of the introduction of the automated network analyzer. On the other hand, for the serious student of metrology, the strategies are of continued interest even if the methods by which they were implemented are not. In the author's experience, an intuitive mental picture of the system operation can be an invaluable asset, although never a substitute for a careful analytical formulation. An example is the tuned reflectometer. Although for most applications the method is obsolete, an understanding of the associated theory can still provide useful insights into the microwave circuit model, and the operation of other measurement techniques."

Full Product Details

Author:   Glenn F. Engen
Publisher:   Institution of Engineering and Technology
Imprint:   Institution of Engineering and Technology
Edition:   illustrated edition
Volume:   No. 9
Dimensions:   Width: 15.60cm , Height: 160.00cm , Length: 23.40cm
ISBN:  

9780863412875


ISBN 10:   0863412874
Pages:   256
Publication Date:   30 June 1992
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Chapter 1: The world of microwaves Chapter 2: Foundations of microwave circuit theory Chapter 3: Elementary boundary conditions Chapter 4: Multi-port boundary conditions Chapter 5: Elementary two-port applications Chapter 6: Amplitude stabilisation and multi-channel isolation Chapter 7: The measurement problem at microwave frequencies Chapter 8: The fundamental equationof microwave metrology Chapter 9: The linear fractional transform Chapter 10: The slotted line technique of impedance measurement Chapter 11: Attenuation measurement Chapter 12: The microwave reflectometer Chapter 13: Precision power measurement Chapter 14: Power meter applications Chapter 15: Power equation methods Chapter 16: The automatic network analyser Chapter 17: The 'Six-port' network analyser Chapter 18: Adapter evaluation techniques Chapter 19: Noise in communication systems Chapter 20: Noise standards and radiometry Chapter 21: A scattering description ofAmplifier noise

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Author Information

During his tenure of more than 30 years at the National Bureau of Standards, Glenn F. Engen has published over forty papers in the field of microwave metrology. His contributions to the art have been recognised by Department of Commerce Gold and Silver Medals, the NBS Applied Research Award, the (Instrumentation and Measurement) Society Award, the Woodington Award for Professionalism in Metrology, the IEEE membership rank of Fellow and the ARFTG Automated Measurement Career Award.

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