Overview

This collection of papers provide an international forum for research professionals to discuss and disseminate their results. It focuses on the developments in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. Advances in the use of other microcharactisation techniques including scanning probe microscopy and X-ray topography and diffraction are also featured. The materials of interest cover the complete range of elemental and compound semiconductors.

Full Product Details

Author:   A.G Cullis (University of Sheffield, UK) ,  R Beanland (GEC-Marconi, Towcester, UK)
Publisher:   Taylor & Francis Ltd
Imprint:   Institute of Physics Publishing
Volume:   No. 164
Dimensions:   Width: 15.60cm , Height: 4.10cm , Length: 23.40cm
Weight:   1.428kg
ISBN:  

9780750306508

ISBN 10:   0750306505
Pages:   772
Publication Date:   01 January 2000
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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A.G Cullis, R Beanland

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