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OverviewWe have come to know that our ability to survive and grow as a nation to a very large degree depends upon our sci- tific progress. Moreover, it is not enough simply to keep abreast of the rest of the world in scientific matters. We 1 must maintain our leadership. President Harry Truman spoke those words in 1950, in the aftermath of World War II and in the midst of the Cold War. Indeed, the scientific and engineering leadership of the United States and its allies in the twentieth century played key roles in the successful outcomes of both World War II and the Cold War, sparing the world the twin horrors of fascism and tota- tarian communism, and fueling the economic prosperity that followed. - day, as the United States and its allies once again find themselves at war, President Truman’s words ring as true as they did a half-century ago. The goal set out in the Truman Administration of maintaining leadership in s- ence has remained the policy of the U. S. government to this day. Dr. John Marburger, the Director of the Office of Science and Technology (OSTP) in the Executive Office of the President, made remarks to that effect during 2 his confirmation hearings in October 2001. The United States needs metrics for measuring its success in meeting this goal of maintaining leadership in science and technology. Full Product DetailsAuthor: Kornel F. Ehmann , David Bourell , Martin L. Culpepper , Thom J. HodgsonPublisher: Springer Imprint: Springer Edition: 2007 ed. Dimensions: Width: 15.50cm , Height: 2.10cm , Length: 23.50cm Weight: 0.611kg ISBN: 9789401784627ISBN 10: 9401784620 Pages: 362 Publication Date: 18 September 2014 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsFrom the contents Foreword.- Table of Contents.- List of Figures.- List of Tables.- Executive Summary.- 1. Introduction: Richard E. DeVor and Kornel F. Ehmann.- 2. Design: Martin L. Culpepper and Thomas R. Kurfess.- 3. Materials: David Bourell and Kamlakar Rajurkar.- 4. Processes: Kamlakar Rajurkar and Marc Madou.- 5. Metrology, Sensors and Control: Thomas R. Kurfess and Thom J. Hodgson.- 6. Non-lithography Applications: Marc Madou.- 7. Business, Education, the Environment, and Other Issues: Thom J. Hodgson.- Appendices: A. Panelist Biographies.- B. Questionnaire for Site Visits.- C. Site Reports—Asia.- D. Site Reports—Europe.- E. Glossary.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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